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Íomhá:AFMsetup.jpg

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English: Typical atomic force microscope (AFM) setup: The deflection of a microfabricated cantilever with a sharp tip is measured by reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample.
Deutsch: Typischer Aufbau eines Rasterkraftmikroskops (RKM): Die Auslenkung eines Abtastarms (Englisch: Cantilever) mit einer feinen Tastspitze wird während des Abtastens der Oberfläche anhand der Auslenkung eines Laserstrahls bestimmt, der von der Oberseite des Abtastarms reflektiert wird.
Dáta 2013-10-13--202.160.164.205 09:49, 3 October 2013 (UTC)--202.160.164.205 09:49, 3 October 2013 (UTC)
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faoi láthair14:10, 21 Samhain 2006Mionsamhail do leagan ó 14:10, 21 Samhain 2006721 × 569 (86 KB)KristianMolhave*Figure Caption: Typical AFM setup. The deflection of a microfabricated cantilever with a sharp tip is measured be reflecting a laser beam off the backside of the cantilever while it is scanning over the surface of the sample. *This illustration was made

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